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Design+ Defect-oriented BIST for AMS circuits

Funding doi: 10.1109/SBCCI55532.2022.9893243

This work was financially supported by Jerry Junkins 5. Xu L, Huang J, Wang H, Long B. A novel method for
Chair Endowment grant provided by Iowa State University the diagnosis of the incipient faults in analog circuits
organization, and 2810-047 and 2810-084 grants from based on LDA and HMM. Circuits Syst Signal Process.
2010;29(4):577-600.
Semiconductor Research Corporation (SRC).
doi: 10.1007/s00034-010-9160-1
Conflict of interest 6. Bailey B. Why Analog Designs Fail. Semiconductor
The authors declare that they have no competing interests. Engineering. Available from: https://semiengineering.
com/making-analog-more-reliable [Last accessed on
Author contributions 2023 Sep 01].
Conceptualization: Mona Ganji, Degang Chen 7. Sekyere M, Saikiran M, Chen D. All-digital Low-cost
Formal analysis: Mona Ganji, Marampally Saikiran, Built-in Defect Testing Strategy for Operational Amplifiers
Kushagra Bhatheja with High Coverage. In: Proceedings of the 2022 IEEE
th
Investigation: Mona Ganji 28 International Symposium on On-Line Testing and Robust
System Design (IOLTS). Torino, Italy: IEEE; 2022. p. 1-5.
Methodology: Mona Ganji, Degang Chen
Writing – original draft: Mona Ganji doi: 10.1109/IOLTS56730.2022.9897224
Writing – review & editing: All authors 8. Sunter S. Efficient Analog Defect Simulation. In: Proceedings
of the 2019 IEEE International Test Conference (ITC).
Ethics approval and consent to participate Washington, DC, USA: IEEE; 2019. p. 1-10.
Not applicable. doi: 10.1109/ITC44170.2019.9000141

Consent for publication 9. P2427 - Standard for Analog Defect Modeling and Coverage.
Available from: https://standards.ieee.org/project/2427.
Not applicable. html [Last accessed on 2020 Dec 16].
10. Pavlidis A, Louërat MM, Faehn E, Kumar A, Stratigopoulos HG.
Availability of data SymBIST: Symmetry-based analog and mixed-signal
Data are available from the corresponding author upon built-in self-test for functional safety. IEEE Trans Circuits
reasonable request. Syst I Regul Pap. 2021;68(6):2580-2593.
doi: 10.1109/TCSI.2021.3067180
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