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Materials Science in Additive Manufacturing                                A ML model for AM PSP of Ti64



              Where, the function p(m,x) represents the probability   were computed in both orthogonal orientations (x and y)
            density of finding the local state m at the spatial location   then concatenated with 2-point correlation function data
            x. In this function,  m and  x can be treated as either   to build up a large feature vector for each microstructure
            continuous variables or discretized descriptors. In this   SVE (i.e., each SEM image). In summary, the PCA input
            study, the Ti-6Al-4V phase information is considered the   deduces microstructure information collected from SEM
            local state space. Therefore, the function f(m,m’|r) denotes   characterization.
            the conditional probability of finding different phases
            (α/β) in spatial bins across a Ti-6Al-4V microstructure,   2.2.2. XRD data extraction
            which are separated by the vector set r.           In addition to the influence of microstructures collected
              According to Liu and Shin (2019), it is important to   from the SEM microstructure, Hansen (1958) indicated
            include multiple descriptors to capture all the elements   that other characterization features, such as residual stress,
            of heterogeneous grain morphology for developing   also have direct effects on mechanical properties and
                                                                               [32]
            a robust microstructure data science PSP linkage .   machining behavior . AM fabrication inherently leads to
                                                        [9]
            Therefore, besides the correlation functions, chord length   a rapid cooling rate and therefore large thermal gradients
                                                               that cause phase transformations, and generates significant
            distributions (CLDs) which are direct descriptors of the   residual stresses. Telrandhe et al. (2017) have shown that
            grain morphology are also applied to the workflow. The   near-surface residual stresses have a significant impact on
            rationale behind this approach is to capture additional   mechanical behavior, such as fatigue and microhardness .
                                                                                                           [33]
            microstructure features of interest in metal AM parts: Grain   During the post-processing of metal AM parts, machining
            size, shape distribution, and their anisotropy. In addition,   is often required to achieve desired geometric dimensioning
            Turner  et  al. (2016) have shown that the chord length   and tolerancing (GD&T), as well as desired surface finish.
            directly connects to the material’s plastic properties, which   Therefore, the near-surface residual stresses play a key role
            could be a valid statistical method for this workflow .   in the post-processing machining behavior of AM surfaces.
                                                        [30]
            The computational cost of CLDs is relatively low and is,   XRD is one of the most widely used non-destructive
            therefore, ideal for this study that aims to analyze a large   near-surface residual stress measurement methods. XRD
            ensemble of microstructures.                       directly measures the strain due to the distortion of the
              In this study, a chord is defined as a line segment   crystalline lattice structure from residual stress.
            that begins and ends at the boundaries of a single grain   In this study, the near-surface residual stress was
            contained within the microstructure. CLDs describe the   considered an independent input to the S-P linkage model.
            probability of locating a chord of a specific length within   Specimens representing each PFB process, heat treatment
            microstructure SVEs. In this study, CLDs were computed   condition, and vertical and horizontal surfaces to build
            in X and Y direction as all microstructure images were   direction were used to  measure  residual stress in the
            collected in the same X and Y plane orientation from   axial direction. All measurements were made using the
            surfaces that share the same X and Y coordinates.  sin ψ technique in an X-ray diffractometer with a Cu K-α
                                                                 2 
              The next step of the microstructure data extraction   source (1.5406 Å). Strain and residual stresses were calculated
            focused on reducing the dimensionality of the      based on the d-spacing and 10 unique  tilts on the {1 0 3}
            representations on each SVE in the microstructure using   crystallographic plane based on the following equation:
            spatial data  statistics  and principal component analysis
            (PCA).  The  PCA  is  a  data-driven  linear  transformation        cos 2  sin 2      sin 2 sin 2
            of extracted data to an orthogonal space that captures the     11        12  2    2

            variance within the dataset with minimum dimension.         13  cossin  2     sin   siin
                                                                                       22
            Kalidindi (2015) presented that the rationale behind       23 sinsin 2      33 cos  #  (II)
                                                                                             2
            this approach is to reduce the dimensions of the dataset
            dimensions to significantly increase computational   Where, the  åφψ represents the strain in the specific
            efficiency and identify the salient features of the     and  ø  tilt.  The  Ti-6Al-4V  elastic  constant  119  GPa
            microstructure to establish the PSP model . Multiple   was used to calculate the residual stress. The stress-free
                                                 [4]
            studies have shown that PCA is an effective tool to produce   d-spacing is not necessary to calculate the residual stress
            low-order, high-value representation of microstructures   in this method. Luo and Yang (2017) have shown that the
            that are valuable for building PSP linkages across a range   d-spacing and  sin ψ  relationship might not be linear .
                                                                              2
                                                                                                           [34]
            of material categories. In addition, Paulson et  al. (2018)   When shear stresses are present, they will be manifested in
            have shown that only a few basic functions contribute to   the d-spacing-sin ψ plot. Hence, strain was calculated for
                                                                             2
            the efficacy of S-P linkage after PCA . In this study, CLDs   different ψ tilts angles in this study using Equation (II) and
                                        [31]
            Volume 1 Issue 1 (2022)                         6                      https://doi.org/10.18063/msam.v1i1.6
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