Page 81 - MSAM-1-1

Materials Science in Additive Manufacturing A ML model for AM PSP of Ti64

were employed in data collection. For every AM surface typical alternate α+β AM Ti-6Al-4V microstructure can
(L-PBF XY HT, L-PBF XZ HT, L-PBF XY NHT, L-PBF XZ be observed. As observed in Figure 4b, the normalized
NHT, EB-PBF XY, and EB-PBF XZ), 200 microstructure 2-point correlation reflects the small grain size and particle
images for a total of 1200 microstructure images were to particle distance, that is, grain density. Figure 4c shows
collected through SEM characterization. that the CLD functions across X and Y directions show

MATLAB batch processing programs were used to a longer grain shape distribution in X-direction than
compute 2-point correlation and CLDs for all SEM images. Y-direction, which was expected in this EB-PBF XZ plane.
Figure 4a shows an example of the EB-PBF Ti-6Al-4V Since the total dimensions of the correlation function
microstructure collected. Small needle-shaped columnar and CLDs for one SVE microstructure vector were over
α grains that grow along the β boundaries to form a 3000, zero and near-zero tail ends of the distribution that
A

B C

Figure 4. Representative Ti-6Al-4V microstructure SVE: (A) SEM secondary electron microstructure observation, (B) 2-point correlation function,
(C) CLDs in both X and Y directions.

Volume 1 Issue 1 (2022) 9 https://doi.org/10.18063/msam.v1i1.6