Page 36 - MSAM-1-2

Materials Science in Additive Manufacturing Intense pulsed light sintering of conductive film

actual sintered film condition, six different sintered films earlier. The surface roughness parameter for each coupon
obtained using different process parameters were used was obtained based on the average surface roughness
and their corresponding surface roughness was analyzed parameters (R , R , and R ) of 3 regions of approximately
ku
z
a
as shown in Figure 3. A qualitative comparison using equal size, as shown in Figure 3.
reconstructed confocal scans of the sintered films can be These six sintered films are randomly selected (from
found on Figure S1 of the supplementary document. The 105 samples) simply to illustrate the different types of
S value was calculated based on the equation as described delamination mode and severity. In general, the surface
A C

B

Figure 2. Definition of different surface roughness parameters. (A) R , (B) R , and (C) R ku [41] .
a
z
A B C

Figure 3. Correlation between surface roughness indicator and the severity of delamination of the sintered film. (A) Coupons with S <0.1 contains no
delamination, (B) coupons with S≈itho suffer mild delamination, and (C) coupons with S>0.3 have severe delamination issue. Turquoise lines show the
sub-sampling region for each coupon.

Volume 1 Issue 2 (2022) 5 http://doi.org/10.18063/msam.v1i2.10