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Materials Science in Additive Manufacturing                        Validation of a novel ML model for AM-PSP



            fitted with the normal curve and calculated the mean value   87% prediction accuracy, which decreased from 90%
            µ and variance σ , which show the grain size distribution.   when only L-PBF materials were considered. However,
                         2
            An ANOVA test was applied to analyze the microstructure   when more feature information was added, the prediction
            difference based on Gaussian coefficients. Table 7 shows   results improved. When SFs and TFs were considered in
            that materials selection, that is, AM processing condition, is   the MP+EBSD condition, the XGBoost model’s accuracy
            statistically highly significant (P = 0.000), which proves that   increased to 95.5% with a large variance, while the
            there is a significant difference among the microstructure   linear regression also increased to 90.5%. Through all
            information. This also shows that the LPBF_XZ samples   five conditions, the XGBoost model proved superior to
            have  a  significant  difference  compared  with  all  other   linear modeling. To analyze the importance of all features
            planes. In addition, the DED_XZ plane is the only surface   included in the new PSP linkages, feature importance
            showing a positive mean value, indicating that the average   analysis was employed to determine the feature impact.
            grain  size  in  the  DED  sample  is  larger  than  the  L-PBF   In the feature analysis, in addition to the machining
            material. The reason for the large negative mean value in   parameters, all residual stresses play important roles in
            the L-PBF sample could be due to the considerable number
            of tiny discontinuous β grains growing along the α or α’   the XGBoost model training. This indicates that the near-
            grain boundary. Therefore, the SEM features in the testing   surface residual stress heavily affects the specific cutting
            set could be outside of the training boundary. This leads to   energy when machining AM Ti-6Al-4V samples. From
            poor results in model prediction. To better understand the   this, SFs on basal slip systems, prismatic slip systems,
            SEM microstructure among these materials, the normal   and TFs form EBSD data measurement are shown in
            distribution was used to represent CLDs, and the power   Figure 10.
            functions were used to represent 2-point correlation   The high-dimension SEM microstructure information
            functions.  Tables  8  and  9 show a pairwise comparison   significantly improves the PSP linkage accuracy. When
            analysis based on the materials’ CLDs and 2-point   combining all features, the high-dimension SEM data do
            representative coefficients.                       not show a significant impact on the model. This may need
              The second condition could solve the above problem.   future in-depth research to reveal the reason, obtain a
            In Figure 9B, when the model training from 80% of all   better method to reduce dimension and extract additional
            data points was collected, the MP condition shows an   microstructure data.

            Table 7. ANOVA of SEM microstructure information among AM Ti‑6AL‑4V
            Variables      Degree of freedom  Sum of squares     Adj SS      Mean of square    F       P‑value
            Materials            7              1328590541     1328590541      189798649      11.20     0.000
            Number               89             1274031245     1274031245      14314958       0.84      0.839
            Residual error      623            10555977115     10555977115     16943783        \          \
            Total               719            13158598901         \              \            \          \
            Abbreviations: Adj SS: Adjusted sum of squares; SEM: Scanning electron microscope.

            Table 8. Comparison of P-values for AM Ti‑6Al‑4V CLDs coefficients
            CLDs coefficient  EB‑PBF   EB‑PBF   LPBFHT      LPBFHT     LPBFNHT     LPBFNHT      DED     DED
                             XY         XZ        XY          XZ         XY           XZ        XY       XZ
            EB-PBF XY         \        0.680      0.348      0.000       0.005       0.000      0.933   0.014
            EB-PBF XZ         \         \         0.819      0.000       0.021       0.000      0.759   0.109
            LPBFHT XY         \         \          \         0.000       0.019       0.000      0.508   0.004
            LPBFHT XZ         \         \          \          \          0.172       0.264      0.000   0.000
            LPBFNHT XY        \         \          \          \           \          0.038      0.010   0.001
            LPBFNHT XZ        \         \          \          \           \            \        0.000   0.000
            DED XY            \         \          \          \           \            \         \      0.096
            DED XZ            \         \          \          \           \            \         \        \
            Abbreviations: CLDs: Chord length distributions; DED: Directed energy deposition; EB-PBF: Electron beam powder bed fusion; LPBF: Laser
            powder bed fusion.


            Volume 2 Issue 3 (2023)                         12                      https://doi.org/10.36922/msam.0999
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